(Traditionally, sampling oscilloscope-based time domain reflectometry (TDR) has been used for cable and printed circuit board testing. Due to the relatively large noise of this kind of oscilloscope, it is difficult to end high-dynamic design and fast measurement together. Although the noise can be reduced by averaging, it will affect the measurement speed. Jitter between multiple signal sources used to measure timing errors on an oscilloscope can also cause measurement errors.)
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